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Please use this identifier to cite or link to this item: http://lrcdrs.bennett.edu.in:80/handle/123456789/1585
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dc.contributor.authorMehla, Virender Kumar-
dc.contributor.authorKumar, Ashish-
dc.contributor.authorSinghal, Amit-
dc.contributor.authorKumar, Manjeet-
dc.contributor.authorKomaragiri, Rama S-
dc.date.accessioned2023-04-11T03:22:20Z-
dc.date.available2023-04-11T03:22:20Z-
dc.date.issued2020-
dc.identifier.isbn9781799821229-
dc.identifier.urihttps://doi.org/10.4018/978-1-7998-2120-5.ch005-
dc.identifier.urihttp://lrcdrs.bennett.edu.in:80/handle/123456789/1585-
dc.description.abstractWith the rapid innovation in the field of healthcare, various biomedical signals, namely, electrocardiogram (ECG), electroencephalogram (EEG), electromyogram (EMG), play a crucial role for accurate measurement of various diseases such as cardiovascular diseases, brain disorders, etc. In the present work, an efficient method based on empirical mode decomposition (EMD) has been proposed to detect the epileptic activity. The present study is composed of three parts. In the first part, EMD is used to decompose the EEG signal into a set of amplitude modulated and frequency modulated components, referred to as intrinsic mode functions (IMFs). In the second part, features such as standard deviation, kurtosis, and Hjorth parameters have been extracted from various IMFs. In the last stage, the features are employed as inputs to support vector machine classifier for classification between non-seizure and seizure EEG signals. The simulation results show that the proposed scheme has attained better classification accuracy when compared to existing state-of-the-art methods. © 2020 by IGI Global. All rights reserved.en_US
dc.language.isoen_USen_US
dc.publisherIGI Globalen_US
dc.subjecthealthcareen_US
dc.subjectelectromyogram (EMG)en_US
dc.subjectelectrocardiogram (ECG)en_US
dc.subjectelectroencephalogram (EEG)en_US
dc.subjectempirical mode decomposition (EMD)en_US
dc.titleClassification of epileptic seizure in EEG signal using support vector machine and EMDen_US
dc.typeBook chapteren_US
dc.indexedscen_US
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